Exploring the Effects of Duty Cycle on Structural, Electrical, and Optical Properties of AgInS2 Films Via Pulse Plating Deposition
The AgInS2 films, which range in thickness from 400 to 900 nm with duty cycles from 6% to 50% at a deposition potential of -1.14 V (SCE), are investigated in this research when they are deposited on conductive glass coated with tin oxide. The films' polycrystalline structure has been confirmed by X-ray diffraction analysis, which shows peaks that correspond to single-phase AgInS2. The binding energies linked to Ag and In are shown using fifty percent duty cycle X-ray photoelectron spectroscopy (XPS). Surface profilometry imaging shows that when the duty cycle rises, both roughness and grain size decrease. While the density of the carriers decreases with increasing duty cycles, the films exhibit an increase in both resistance and mobility. The films demonstrate enhanced efficiency in photoelectrochemical cells in addition to increased photoconductivity. At 0.93 V (SCE), the flat band potential is determined, confirming p-type conductivity. The photoluminescence spectrum exhibits a significant peak at 820 nm, whereas the spectra of Raman shows peaks typical of the chalcopyrite structure.